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Beilstein J. Nanotechnol. 2019, 10, 79–94, doi:10.3762/bjnano.10.8
Figure 1: Pathway to fabricate dimple arrays with and without terminal layers. Starting from the left: deposi...
Figure 2: SEM and AFM images of micropatterns from sub-microscale particles. Left: Top view of the dimple mic...
Figure 3: SEM images of micropatterns from microscale particles. Left: Micropattern with a terminal layer. Th...
Figure 4: Representative force–time plots of pull-off force (top row) and friction (bottom row) measurements ...
Figure 5: Pull-off stress (pull-off force divided by the sample area) for flat samples, sub-microscale dimple...
Figure 6: Pull-off stress for flat samples, sub-microscale samples without terminal layer and microscale samp...
Figure 7: Friction stress (friction force divided by the sample area) for flat samples, sub-microscale sample...
Figure 8: Friction stress for flat samples, sub-microscale samples without terminal layer, and microscale sam...
Figure 9: Schematic representation of the customized measuring setup in the configuration of a pull-off force...
Figure 10: Overview of the tested conditions.